35979-0410,Top sales 35979-0410,35979-0410 DATASHEET -ICSTOCK

a.Pulse Test:Pulse Width <300 ru s Duty Cycle <2%.

b.Guaranteed by design, not subject to production testing
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35979-0410 datasheet

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35979-0410 price

Note l. IE, VEC, trr, Orr, die/dt represent characteristics of the anti-parallel, emitter to collector free-wheel diode. (FWDi)
2. Pulse width and repetition rate should be such that the device junction temp. (Ti) does not exceed Tjmax rating.
3. Junction temperature (Ti) should not increase beyond 150YC.
4. Pulse width and repetition rate should be such as to cause negligible temperature rise.
*1 : Te measured point is indicated in OUTLINE DRAWING.
*2 : Typical value is measured by using Shin-etsu Silicone "G-746".
*3 : If you use this value, Rth(f-a; should be measured just under the chips.
35979-0410 pdf




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